Product Description
Infrared radiations are the measurement method employed to determine the thickness of the materials usually used as a barrier, for example EVOH and PA. The module of measurement, composed by an emitter and a receiver, is installed on a standard scanner for the measurement in transmission mode, individually or matching other devices, for example ß or X sensors, in order to make a transversal reading of a barrier layer simultaneous to the one of total weight/thickness. The sensor management and the profiles display on the operator console of the measurement system is completely integrated with that of the total measurement. The sensor can be personalised depending on specific needs required by the application:
• Edges detector of encapsulated films (beginning of barrier layer)
• Automatic correction of the profile of total thickness (detected by X or ß ray sensors, depending on the specific weight of each layer), in case of no uniform
DIGILAYER sensor can be assembled on board of any scanning device that works for transmission between the ones included in the range of Electronic Systems products:
• SLIM DUPLEX
• HISCAN
• TWIN™ SCANNING