™, covered by an exclusive patent, takes advantage of potential and versatility of two independent measuring sensors used in cross scanning way. It is currently the instrument that guarantees the best measurement and automatic control performances.

Main features:

• twice the scan reading speed
• extremely fast cross direction automatic controls
• simultaneous measurement of both material edges
• different scanning ways selectable by the operator
• system total back-up (possibility to work with only one sensor)



• Fast Start: start-up times reduced to minimum for each production change; both measuring heads position themselves on material sides
  

™ allows to realize very fast automatic controls and quality results hardly to get with any other measuring system.

has brought important innovations to basis-weight measuring sensors, using high efficiency solid state detectors instead of ionisation chambers. New sensors, patented and called , have the following advantages:

• Radioactive activity reduction
• Patented sensor geometry adapted to all exigencies
• Very high acquisition sample-time
• Very high signal-to-noise ratio
• Resolution selectable according to exigencies

For measurement and control of multi-layer materials applied in sequence has already introduced its ™ System (measurements synchronization), which allows the acquisition of single layer basis-weight values.

system allows to:

• multi-layers correlated basis-weight
• synchronized measurement, in differential way and at the same point
• direct control of basis-weight in laminated and/or coated materials
• display of profiles divided by layers and/or sectors
• material edges automatic control